ESTIMATING CORN YIELD IN THE UNITED STATES WITH MODIS EVI AND MACHINE LEARNING METHODS
Keywords: Support Vector Machine, Artificial Neural Network, Deep Learning, MODIS EVI, Wavelet Transform, Corn Yield
Abstract. Satellite remote sensing is commonly used to monitor crop yield in wide areas. Because many parameters are necessary for crop yield estimation, modelling the relationships between parameters and crop yield is generally complicated. Several methodologies using machine learning have been proposed to solve this issue, but the accuracy of county-level estimation remains to be improved. In addition, estimating county-level crop yield across an entire country has not yet been achieved. In this study, we applied a deep neural network (DNN) to estimate corn yield. We evaluated the estimation accuracy of the DNN model by comparing it with other models trained by different machine learning algorithms. We also prepared two time-series datasets differing in duration and confirmed the feature extraction performance of models by inputting each dataset. As a result, the DNN estimated county-level corn yield for the entire area of the United States with a determination coefficient (R2) of 0.780 and a root mean square error (RMSE) of 18.2 bushels/acre. In addition, our results showed that estimation models that were trained by a neural network extracted features from the input data better than an existing machine learning algorithm.