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<front>
<journal-meta>
<journal-id journal-id-type="publisher">ISPRS-Annals</journal-id>
<journal-title-group>
<journal-title>ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences</journal-title>
<abbrev-journal-title abbrev-type="publisher">ISPRS-Annals</abbrev-journal-title>
<abbrev-journal-title abbrev-type="nlm-ta">ISPRS Ann. Photogramm. Remote Sens. Spatial Inf. Sci.</abbrev-journal-title>
</journal-title-group>
<issn pub-type="epub">2194-9050</issn>
<publisher><publisher-name>Copernicus Publications</publisher-name>
<publisher-loc>Göttingen, Germany</publisher-loc>
</publisher>
</journal-meta>
<article-meta>
<article-id pub-id-type="doi">10.5194/isprs-annals-XI-4-2026-197-2026</article-id>
<title-group>
<article-title>Consumer&apos;s Risk in Zero-defect Sampling Inspection of Surveying and Mapping Products</article-title>
</title-group>
<contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Luo</surname>
<given-names>Fujun</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Zhao</surname>
<given-names>Haitao</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Liu</surname>
<given-names>Jinghu</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Wang</surname>
<given-names>Xiaodi</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Chen</surname>
<given-names>Chunxi</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
</contrib-group><aff id="aff1">
<label>1</label>
<addr-line>National Quality Inspection and Testing Center for Surveying and Mapping Products, Beijing, China</addr-line>
</aff>
<aff id="aff2">
<label>2</label>
<addr-line>Technology Innovation Center for Remote Sensing Intelligent Verification, Ministry of Natural Resources, Beijing, China</addr-line>
</aff>
<pub-date pub-type="epub">
<day>10</day>
<month>07</month>
<year>2026</year>
</pub-date>
<volume>XI-4-2026</volume>
<fpage>197</fpage>
<lpage>203</lpage>
<permissions>
<copyright-statement>Copyright: &#x000a9; 2026 Fujun Luo et al.</copyright-statement>
<copyright-year>2026</copyright-year>
<license license-type="open-access">
<license-p>This work is licensed under the Creative Commons Attribution 4.0 International License. To view a copy of this licence, visit <ext-link ext-link-type="uri"  xlink:href="https://creativecommons.org/licenses/by/4.0/">https://creativecommons.org/licenses/by/4.0/</ext-link></license-p>
</license>
</permissions>
<self-uri xlink:href="https://isprs-annals.copernicus.org/articles/XI-4-2026/197/2026/isprs-annals-XI-4-2026-197-2026.html">This article is available from https://isprs-annals.copernicus.org/articles/XI-4-2026/197/2026/isprs-annals-XI-4-2026-197-2026.html</self-uri>
<self-uri xlink:href="https://isprs-annals.copernicus.org/articles/XI-4-2026/197/2026/isprs-annals-XI-4-2026-197-2026.pdf">The full text article is available as a PDF file from https://isprs-annals.copernicus.org/articles/XI-4-2026/197/2026/isprs-annals-XI-4-2026-197-2026.pdf</self-uri>
<abstract>
<p>Through theoretical analysis and empirical research, this study thoroughly examines the theoretical foundations and practical applications of zero-defect sampling inspection schemes, revealing significant differences between inspecting large lots as a whole versus splitting them into sub-lots in terms of consumer&apos;s risk control. The findings indicate that although the zero-defect sampling scheme (Ac=0) adopted in the GB/T 24356-2023 standard shifts quality control from &quot;post-production spot checks&quot; toward &quot;in-process prevention&quot;, it exhibits notable deficiencies in controlling consumer&apos;s risk, resulting in an unacceptably high level of risk for consumers. Empirical analysis demonstrates that, for large lots with relatively poor quality, e.g., when the product&apos;s defect rate is 10%, the inspection plan (100, 10, 0) still carries a 33.3% probability of erroneously accepting the lot, which significantly exceeds the risk level typically acceptable to consumers and thus imposes excessive quality risk on them. Furthermore, the study reveals that inspecting small lots or subdividing large lots benefits producers, highlighting an imbalance in the current standard&apos;s risk allocation mechanism. These insights provide more reliable theoretical support and practical guidance for quality management of surveying and mapping products.</p>
</abstract>
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